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Testing method for a semiconductor integrated circuit device, semiconductor integrated circuit device and testing system
Testing method for a semiconductor integrated circuit device, semiconductor integrated circuit device and testing system
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机译:半导体集成电路器件的测试方法,半导体集成电路器件和测试系统
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摘要
A method that divides semiconductor integrated circuit devices (corresponding to S1 and S2) into a plurality of groups and tests them simultaneously has the semiconductor integrated circuit devices operate with a clock signal (corresponding to CLK1 and CLK2) having a frequency different from that in other groups in at least one group. A test is performed without decreasing the number of chips tested at one time.
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