首页> 外国专利> HIGH-K METAL GATE ELECTRODE STRUCTURES FORMED AT DIFFERENT PROCESS STAGES OF A SEMICONDUCTOR DEVICE

HIGH-K METAL GATE ELECTRODE STRUCTURES FORMED AT DIFFERENT PROCESS STAGES OF A SEMICONDUCTOR DEVICE

机译:在半导体器件的不同过程阶段形成的高K金属栅电极结构

摘要

Sophisticated high-k metal gate electrode structures are provided on the basis of a hybrid process strategy in which the work function of certain gate electrode structures is adjusted in an early manufacturing stage, while, in other gate electrode structures, the initial gate stack is used as a dummy material and is replaced in a very advanced manufacturing stage. In this manner, superior overall process robustness in combination with enhanced device performance may be achieved.
机译:在混合工艺策略的基础上,提供了复杂的高k金属栅电极结构,其中某些栅电极结构的功函数在制造的早期阶段就已进行了调整,而在其他栅电极结构中,则使用了初始栅叠层作为虚拟材料,并在非常先进的制造阶段被替换。以这种方式,可以实现与增强的设备性能相结合的优异的整体工艺鲁棒性。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号