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Method for inspecting settling time of deflection amplifier, and method for judging failure of deflection amplifier

机译:偏转放大器的建立时间检查方法及偏转放大器的故障判断方法

摘要

A method for inspecting a settling time of a deflection amplifier includes setting a settling time, performing shooting a plurality of times alternately to project two patterns of different types which are shaped by making a charged particle beam pass through a first and a second apertures while deflecting the charged particle beam by a deflector controlled by an output of a deflection amplifier which is driven based on the settling time having been set, measuring beam currents of the shooting, calculating an integral current of the beam currents measured, and calculating a difference between the integral current calculated and a reference integral current to output the difference.
机译:一种检查偏转放大器的建立时间的方法,包括设置建立时间,交替执行多次拍摄以投射不同类型的两个图案,所述两个不同类型的图案通过使带电粒子束在偏转的同时穿过第一和第二孔而成形由偏转器的输出控制的偏转器带电的粒子束,偏转器的输出基于已设置的稳定时间,测量射束的束流电流,计算所测得束流的积分电流,并计算两者之间的差计算出的积分电流与输出的参考积分电流之差。

著录项

  • 公开/公告号US7989777B2

    专利类型

  • 公开/公告日2011-08-02

    原文格式PDF

  • 申请/专利权人 YOSHIKUNI GOSHIMA;

    申请/专利号US20090432874

  • 发明设计人 YOSHIKUNI GOSHIMA;

    申请日2009-04-30

  • 分类号G21K1/087;

  • 国家 US

  • 入库时间 2022-08-21 18:09:45

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