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Solving via-misalignment issues in interconnect structures having air-gaps
Solving via-misalignment issues in interconnect structures having air-gaps
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机译:解决具有气隙的互连结构中的过孔未对准问题
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摘要
An integrated circuit structure is provided. The integrated circuit structure includes a semiconductor substrate; and a metallization layer over the semiconductor substrate. The metallization layer includes a conductive line; a low-k dielectric region adjacent and horizontally spaced apart from the conductive line by a space; and a filler dielectric material filling at least a portion of the space, wherein the filler dielectric material and the low-k dielectric region are formed of different materials. The integrated circuit structure further includes a capping layer over and adjoining the filler dielectric material and the low-k dielectric region. The filler dielectric material has a dielectric constant (k value) less than a k value of the capping layer.
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