首页> 外国专利> Methods of etching nanodots, methods of removing nanodots from substrates, methods of fabricating integrated circuit devices, methods of etching a layer comprising a late transition metal, and methods of removing a layer comprising a late transition metal from a substrate

Methods of etching nanodots, methods of removing nanodots from substrates, methods of fabricating integrated circuit devices, methods of etching a layer comprising a late transition metal, and methods of removing a layer comprising a late transition metal from a substrate

机译:蚀刻纳米点的方法,从衬底去除纳米点的方法,制造集成电路器件的方法,蚀刻包括后过渡金属的层的方法以及从衬底去除包括后过渡金属的层的方法

摘要

Embodiments of the invention include methods of etching nanodots, to methods of removing nanodots from substrates, and to methods of fabricating integrated circuit devices. In one embodiment, a method of etching nanodots that include a late transition metal includes exposing such nanodots to a gas comprising a phosphorus and halogen-containing compound and an oxidizing agent. After the exposing, the nanodots which are remaining and were exposed are etched (either partially or completely) with an aqueous solution comprising HF.
机译:本发明的实施例包括蚀刻纳米点的方法,从基板去除纳米点的方法以及制造集成电路器件的方法。在一个实施例中,一种蚀刻包括后过渡金属的纳米点的方法包括将这种纳米点暴露于包含磷和卤素的化合物以及氧化剂的气体中。暴露后,用包含HF的水溶液蚀刻(部分或全部)残留和暴露的纳米点。

著录项

  • 公开/公告号US7993539B2

    专利类型

  • 公开/公告日2011-08-09

    原文格式PDF

  • 申请/专利权人 EUGENE P. MARSH;

    申请/专利号US20100914814

  • 发明设计人 EUGENE P. MARSH;

    申请日2010-10-28

  • 分类号B44C1/22;C03C15;C03C25/68;C23F1;

  • 国家 US

  • 入库时间 2022-08-21 18:09:23

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