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Semiconductor device method of manfacturing a quantum well structure and a semiconductor device comprising such a quantum well structure

机译:制造量子阱结构的半导体器件方法和包括该量子阱结构的半导体器件

摘要

A semiconductor device (1) and a method are disclosed for obtaining on a substrate (2) a multilayer structure (3) with a quantum well structure (4). The quantum well structure (4) comprises a semiconductor layer (5) sandwiched by insulating layers (6,6′), wherein the material of the insulating layers (6,6′) has preferably a high dielectric constant. In a FET the quantum wells (4,9) function as channels, allowing a higher drive current and a lower off current. Short channel effects are reduced. The multi-channel FET is suitable to operate even for sub-35 nm gate lengths.;In the method the quantum wells are formed by epitaxial growth of the high dielectric constant material and the semiconductor material alternately on top of each other, preferably with MBE.
机译:公开了一种用于在基板( 2 )上获得具有量子阱的多层结构( 3 )的半导体器件( 1 )和方法。结构( 4 )。量子阱结构( 4 )包括被绝缘层( 6,6')夹在中间的半导体层( 5 ),其中绝缘层( 6,6')优选具有高介电常数。在FET中,量子阱( 4,9 )用作通道,从而允许更高的驱动电流和更低的截止电流。减少了短通道效应。多通道FET甚至适用于栅极长度小于35 nm的情况。在该方法中,量子阱是由高介电常数材料和半导体材料交替外延生长而形成的,最好交替使用MBE 。

著录项

  • 公开/公告号US7951684B2

    专利类型

  • 公开/公告日2011-05-31

    原文格式PDF

  • 申请/专利权人 YOURI PONOMAREV;

    申请/专利号US20090429348

  • 发明设计人 YOURI PONOMAREV;

    申请日2009-04-24

  • 分类号H01L21/76;

  • 国家 US

  • 入库时间 2022-08-21 18:09:02

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