首页> 外文OA文献 >Selective oxidation of aluminum-bearing III-V semiconductors: Properties and applications to quantum well heterostructure lasers and transistor devices
【2h】

Selective oxidation of aluminum-bearing III-V semiconductors: Properties and applications to quantum well heterostructure lasers and transistor devices

机译:含铝III-V半导体的选择性氧化:量子阱异质结构激光器和晶体管器件的特性和应用

摘要

In this work, the water vapor oxidation of Al-bearing III-V compound semiconductors is used to fabricate light-emitting and electronic devices. High Al-composition heterostructure crystals such as Al$sb{m x}$Ga$sb{m 1-x}$As (x $sbsp{sim}{>}$ 0.5) are converted into a stable native oxide at moderately elevated temperatures ($sbsp{sim}{>}400 spcirc$C) in a water vapor saturated ambient. Dependence of the oxidation process on Al composition makes possible the formation of embedded oxide layers in between semiconductor crystal using selective (lateral) oxidation. Data are presented showing how various growth parameters, crystal layering, and oxidation times and temperatures affect the lateral oxidation process. Etch studies of superlattice structures that are Zn-diffused and oxidized are also presented showing that the water vapor oxidation process behaves similarly to chemical wet etches.
机译:在这项工作中,含铝III-V化合物半导体的水蒸气氧化被用于制造发光和电子设备。高Al组成的异质结构晶体,例如Al $ sb { rm x} $ Ga $ sb { rm 1-x} $ As(x $ sbsp { sim} {>} $ 0.5)被转换为在水蒸气饱和的环境中适度升高的温度($ sbsp { sim} {>} 400 sp circ $ C)稳定的天然氧化物。氧化过程对Al成分的依赖性使得可以使用选择性(横向)氧化在半导体晶体之间形成嵌入的氧化物层。数据显示了各种生长参数,晶体分层,氧化时间和温度如何影响横向氧化过程。还对锌扩散和氧化的超晶格结构进行了刻蚀研究,表明水蒸气氧化过程的行为类似于化学湿法刻蚀。

著录项

  • 作者

    Chen Eugene I-Chun;

  • 作者单位
  • 年度 1996
  • 总页数
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 入库时间 2022-08-31 16:44:19

相似文献

  • 外文文献
  • 中文文献
  • 专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号