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Group-III nitride based high electron mobility transistor (HEMT) with barrier/spacer layer

机译:带有势垒/隔离层的基于III族氮化物的高电子迁移率晶体管(HEMT)

摘要

A group III nitride based high electron mobility transistor (HEMT), comprises; a semiconductor buffer layer; a high polarization semiconductor layer on said buffer layer; a semiconductor barrier layer on said high polarization layer so that said high polarization layer is sandwiched between said buffer and barrier layers, each of said layers having a non-zero total polarization pointing in the same direction, the magnitude of said polarization in said high polarization layer higher than the polarization of said buffer and barrier layers; and a two dimensional electron gas at the interface between said buffer layer and said high polarization layer.
机译:基于III族氮化物的高电子迁移率晶体管(HEMT),包括:半导体缓冲层;在所述缓冲层上的高极化半导体层;在所述高偏振层上的半导体阻挡层,使得所述高偏振层夹在所述缓冲层和阻挡层之间,每个所述层具有指向相同方向的非零总偏振,所述高偏振下的所述偏振的大小高于所述缓冲层和阻挡层的极化的层;在所述缓冲层和所述高极化层之间的界面处具有二维电子气。

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