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Housing for vacuum encapsulation of an electromechanical microsystem, associated assembly and method for detecting a solder problem in such an assembly
Housing for vacuum encapsulation of an electromechanical microsystem, associated assembly and method for detecting a solder problem in such an assembly
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机译:用于机电微系统的真空封装的壳体,相关组件以及用于检测这种组件中的焊料问题的方法
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摘要
The housing (BT) has a metallic bottom part connected to a microelectro-mechanical system assembly, and output electrical contacts (CES) electrically connected to electrical contact elements of the system. The bottom part comprises metallized surface portions (PSM) that are defined by a non-metallic solder stop zone and connected to a rest of the bottom part by a metallic track (PTEM) having width smaller than width of the corresponding surface portion. The surface portions are soldered to the system. An independent claim is also included for a method for detecting soldering problem in a microelectro-mechanical system assembly.
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