首页> 外国专利> Housing for vacuum encapsulation of an electromechanical microsystem, associated assembly and method for detecting a solder problem in such an assembly

Housing for vacuum encapsulation of an electromechanical microsystem, associated assembly and method for detecting a solder problem in such an assembly

机译:用于机电微系统的真空封装的壳体,相关组件以及用于检测这种组件中的焊料问题的方法

摘要

The housing (BT) has a metallic bottom part connected to a microelectro-mechanical system assembly, and output electrical contacts (CES) electrically connected to electrical contact elements of the system. The bottom part comprises metallized surface portions (PSM) that are defined by a non-metallic solder stop zone and connected to a rest of the bottom part by a metallic track (PTEM) having width smaller than width of the corresponding surface portion. The surface portions are soldered to the system. An independent claim is also included for a method for detecting soldering problem in a microelectro-mechanical system assembly.
机译:壳体(BT)具有连接至微机电系统组件的金属底部,以及电连接至系统的电接触元件的输出电触头(CES)。底部包括由非金属焊料停止区限定的金属化表面部分(PSM),并通过宽度小于相应表面部分的宽度的金属轨道(PTEM)连接到底部的其余部分。表面部分焊接到系统上。还包括用于检测微机电系统组件中的焊接问题的方法的独立权利要求。

著录项

  • 公开/公告号EP2371760A1

    专利类型

  • 公开/公告日2011-10-05

    原文格式PDF

  • 申请/专利权人 THALES;

    申请/专利号EP20110160729

  • 发明设计人 LEDUC DOMINIQUE;LEVERRIER BERTRAND;

    申请日2011-03-31

  • 分类号B81B7/00;

  • 国家 EP

  • 入库时间 2022-08-21 17:53:31

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