首页> 外国专利> METHOD FOR MANUFACTURING A CHARGE TRAP TYPE FLASH MEMORY DEVICE, CAPABLE OF IMPROVING INTEGRATION AND SIMPLIFYING PROCESSES

METHOD FOR MANUFACTURING A CHARGE TRAP TYPE FLASH MEMORY DEVICE, CAPABLE OF IMPROVING INTEGRATION AND SIMPLIFYING PROCESSES

机译:能够改善集成和简化过程的电荷捕捉型闪存存储器的制造方法

摘要

PURPOSE: A method for manufacturing a charge trap type flash memory device is provided to improve the electric property of the charge trap type flash memory device by including a charge trap layer which is electrically separated by a charge blocking pattern.;CONSTITUTION: A first selection transistor with an active layer(100) made of a poly silicon layer is formed on a substrate. An interlayer insulation layer(160) is formed on the substrate. A conductive layer(170) and an insulation layer(180) are alternatively formed on the interlayer insulation layer. A through hole is formed to expose the channel region of the first selection transistor. A tunneling layer, a charge trap layer, and a blocking layer are successively formed on the side of the through hole.;COPYRIGHT KIPO 2011
机译:目的:提供一种电荷陷阱型闪存器件的制造方法,以通过包括通过电荷阻挡图案电隔离的电荷陷阱层来改善电荷陷阱型闪存器件的电性能。组成:第一选择在基板上形成具有由多晶硅层构成的有源层(100)的晶体管。在基板上形成层间绝缘层(160)。交替地在层间绝缘层上形成导电层(170)和绝缘层(180)。形成通孔以暴露第一选择晶体管的沟道区。在通孔的侧面依次形成隧道层,电荷陷阱层和阻挡层。; COPYRIGHT KIPO 2011

著录项

  • 公开/公告号KR20100127111A

    专利类型

  • 公开/公告日2010-12-03

    原文格式PDF

  • 申请/专利权人 HYNIX SEMICONDUCTOR INC.;

    申请/专利号KR20090045639

  • 发明设计人 LEE SANG BUM;OM JAE CHUL;KIM SUK GOO;

    申请日2009-05-25

  • 分类号H01L21/8247;H01L21/336;

  • 国家 KR

  • 入库时间 2022-08-21 17:53:13

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