首页> 外国专利> COMPOSITION FOR WET ETCHING CAPABLE OF ETCHING ONLY A SILICON OXIDE LAYER WITHOUT INFLUENCING THE ETCHING OF A SILICON NITRIDE LAYER

COMPOSITION FOR WET ETCHING CAPABLE OF ETCHING ONLY A SILICON OXIDE LAYER WITHOUT INFLUENCING THE ETCHING OF A SILICON NITRIDE LAYER

机译:用于湿法蚀刻的组合物,能够仅对氧化硅层进行蚀刻而不会影响对氮化硅层的蚀刻

摘要

PURPOSE: A composition for wet etching is provided to minimize an etching rate to a silicon oxide layer, to selectively remove only the silicon oxide layer, and to ensure high-temperature stability.;CONSTITUTION: A composition for wet etching a silicon oxide layer comprises 0.01-2 weight% of a silicon compound of chemical formula 1, 0.001-1 weight% of an oxime compound of chemical formula 2, and 97-99.98 weight% of phosphoric acids. In chemical formulas 1 and 2, R^1, R^2, R^3 and R^4 are independently selected from hydrogen, (C1-20)alkyl, (C1-20)alkoxy, (C2-20)alkenyl, (C3-20)cycloalkyl, amino(C1-20)alkyl, amino(C1-10)alkylamino(C1-10)alkyl, (C6-20)aryl, (C1-20)alkylcarbonyl, (C1-20)alkylcarbonyloxy and cyano(C1-10)alkyl.;COPYRIGHT KIPO 2011
机译:目的:提供用于湿法刻蚀的组合物,以最小化对氧化硅层的刻蚀速率,仅选择性地去除氧化硅层,并确保高温稳定性。 0.01-2重量%的化学式1的硅化合物,0.001-1重量%的化学式2的肟化合物和97-99.98重量%的磷酸。在化学式1和2中,R ^ 1,R ^ 2,R ^ 3和R ^ 4独立地选自氢,(C1-20)烷基,(C1-20)烷氧基,(C2-20)烯基,( C3-20)环烷基,氨基(C1-20)烷基,氨基(C1-10)烷基氨基(C1-10)烷基,(C6-20)芳基,(C1-20)烷基羰基,(C1-20)烷基羰基氧基和氰基(C1-10)烷基。; COPYRIGHT KIPO 2011

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