首页> 外国专利> COMPOSITION FOR ETCHING A SILICON OXIDE LAYER WITH HIGH ETCHING SELECTIVITY OF A SILICON OXIDE LAYER TO A NITRIDE LAYER AND A METHOD FOR ETCHING A SILICON OXIDE LAYER USING THE SAME

COMPOSITION FOR ETCHING A SILICON OXIDE LAYER WITH HIGH ETCHING SELECTIVITY OF A SILICON OXIDE LAYER TO A NITRIDE LAYER AND A METHOD FOR ETCHING A SILICON OXIDE LAYER USING THE SAME

机译:具有较高的氧化硅层对氮化物层的刻蚀选择性的刻蚀氧化硅层的组合物以及使用该方法刻蚀氧化硅层的方法

摘要

PURPOSE: A composition for etching a silicon oxide layer is provided to lowering an etching rate of various nitride layers while maintaining high etching rate of various silicon oxide layers presented a substrate.;CONSTITUTION: A composition for etching a silicon oxide layer comprises hydrogen fluoride, anionic polymer and deionized water. The anionic polymer is included in the amount of 0.001-2 weight% based on the total amount of the composition for etching a silicon oxide layer. The etching selectivity of a silicon oxide layer to a nitride layer is 80 or more. The anionic polymer is selected from the group consisting of polyacrylic acid, polysulfonic acid, polyacrylamide/acrylic acid copolymer, polyacrylic acid/sulfonic acid copolymer, polysulfonic acid/acrylamide copolymer, polyacrylic acid/malonic acid copolymer, and their combination.;COPYRIGHT KIPO 2010
机译:目的:提供一种用于蚀刻氧化硅层的组合物,以降低各种氮化物层的蚀刻速率,同时保持呈现给基板的各种氧化硅层的高蚀刻速率。;构成:一种用于蚀刻氧化硅层的组合物,包括氟化氢,阴离子聚合物和去离子水。基于用于蚀刻氧化硅层的组合物的总量,以0.001〜2重量%的量包含阴离子聚合物。氧化硅层对氮化物层的蚀刻选择性为80以上。阴离子聚合物选自聚丙烯酸,聚磺酸,聚丙烯酰胺/丙烯酸共聚物,聚丙烯酸/磺酸共聚物,聚磺酸/丙烯酰胺共聚物,聚丙烯酸/丙二酸共聚物及其组合。COPYRIGHT KIPO 2010

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