首页> 外国专利> MANUFACTURING METHOD OF A SEMICONDUCTOR DEVICE EQUIPPED WITH THE BURIED GATE, CAPABLE OF PREVENTING THE PROPERTY DETERIORATION OF THE SEMICONDUCTOR

MANUFACTURING METHOD OF A SEMICONDUCTOR DEVICE EQUIPPED WITH THE BURIED GATE, CAPABLE OF PREVENTING THE PROPERTY DETERIORATION OF THE SEMICONDUCTOR

机译:带有埋入式浇口的半导体装置的制造方法,能够防止半导体的特性劣化

摘要

PURPOSE: A manufacturing method of a semiconductor device equipped with the buried gate is provided to prevent the formation of a protrusion on a boundary area between a cell area and a peri area by forming a gate conductive layer on the peri area before forming a plug.;CONSTITUTION: A gate conductive film(37A) is selectively formed on the peri area of a substrate(31) having the cell area and the peri area. A sealing film(39) is formed along the structure surface including the gate conductive film. An insulating layer(40A) is formed on the sealing film in order to cover the structure including the gate conductive film.;COPYRIGHT KIPO 2011
机译:目的:提供一种具有掩埋栅的半导体器件的制造方法,以通过在形成插头之前在周边区域上形成栅极导电层来防止在单元区域和周边区域之间的边界区域上形成突起。组成:在具有单元区域和周边区域的衬底(31)的周边区域上选择性地形成栅极导电膜(37A)。沿着包括栅极导电膜的结构表面形成密封膜(39)。为了覆盖包括栅极导电膜的结构,在密封膜上形成绝缘层(40A)。COPYRIGHTKIPO 2011

著录项

  • 公开/公告号KR20110038847A

    专利类型

  • 公开/公告日2011-04-15

    原文格式PDF

  • 申请/专利权人 HYNIX SEMICONDUCTOR INC.;

    申请/专利号KR20090096019

  • 发明设计人 LIM JI MIN;HWANG KYUNG HO;

    申请日2009-10-09

  • 分类号H01L21/336;

  • 国家 KR

  • 入库时间 2022-08-21 17:52:10

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