首页> 外国专利> METHOD AND SYSTEM FOR ETCHING A SILICON OXIDE FILM USING A DENSE CARBON DIOXIDE CAPABLE OF ELIMINATING A SILICON OXIDE FILM USED AS A SACRIFICIAL FILM

METHOD AND SYSTEM FOR ETCHING A SILICON OXIDE FILM USING A DENSE CARBON DIOXIDE CAPABLE OF ELIMINATING A SILICON OXIDE FILM USED AS A SACRIFICIAL FILM

机译:用能消除用作牺牲膜的氧化硅膜的稠密二氧化碳来氧化氧化硅膜的方法和系统

摘要

PURPOSE: A method and system for etching a silicon oxide film using a dense carbon dioxide are provided to eliminate generation of etching byproducts, thereby omitting an additional cleaning process.;CONSTITUTION: A semiconductor substrate for forming a structure is provided into a processing chamber(S10). Highly dense carbon dioxide is supplied into the processing chamber to etch a sacrificial film(S20). Pure highly dense carbon dioxide is supplied so that fluid in the processing chamber is eliminated(S30). The pressure of the processing chamber is lowered so that the substrate is dried(S40).;COPYRIGHT KIPO 2011
机译:用途:提供一种使用致密二氧化碳刻蚀氧化硅膜的方法和系统,以消除刻蚀副产物的产生,从而省去了额外的清洁工艺。;构成:将用于形成结构的半导体基板提供到处理室( S10)。将高密度的二氧化碳供应到处理室中以蚀刻牺牲膜(S20)。供应纯的高密度二氧化碳,以消除处理室内的流体(S30)。降低处理室的压力,使基材干燥(S40)。; COPYRIGHT KIPO 2011

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