首页> 外国专利> METHOD FOR ANALYZING TWO KINDS OR MORE OF TARGET MATERIALS, A MICROFLUIDIC STRUCTURE USING THE SAME AND MICROFLUIDIC DEVICE COMPRISING THE SAME

METHOD FOR ANALYZING TWO KINDS OR MORE OF TARGET MATERIALS, A MICROFLUIDIC STRUCTURE USING THE SAME AND MICROFLUIDIC DEVICE COMPRISING THE SAME

机译:分析两种或更多种目标材料的方法,使用相同的微流体结构和包含相同的微流体设备

摘要

PURPOSE: A method for analyzing two kinds or more of target materials is provided to enable the detection of two kinds or more of target materials and to stably and uniformly analyze target materials. ;CONSTITUTION: A method for analyzing two kinds or more of target materials comprises the steps of: injecting a sample including two kinds or more of target materials and a second material which is specifically reactive to the target materials and is connected to markers, into a first reaction chamber in which the first material specifically reactive to two kinds or more of target materials; washing unreacted materials within the first reaction chamber; and inducing a reactant within the first reaction chamber to a second reaction chamber containing clinical chemical reagents, and then detecting signals from the detected materials.;COPYRIGHT KIPO 2011
机译:目的:提供一种用于分析两种或更多种目标材料的方法,以能够检测两种或更多种目标材料并稳定,均匀地分析目标材料。 ;组成:一种用于分析两种或多种目标材料的方法,包括以下步骤:将包含两种或多种目标材料和对目标材料具有特异性反应性并与标记物连接的第二种材料的样品注入到样品中。第一反应室,其中第一材料对两种或更多种目标材料具有特异性反应;在第一反应室内洗涤未反应的材料;将第一反应室内的反应物引入装有临床化学试剂的第二反应室内,然后从检测到的材料中检测信号。; COPYRIGHT KIPO 2011

著录项

  • 公开/公告号KR20110064572A

    专利类型

  • 公开/公告日2011-06-15

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号KR20090121242

  • 发明设计人 LEE BEOM SEOK;LEE JUNG NAM;

    申请日2009-12-08

  • 分类号G01N35/00;G01N35/10;G01N33/48;

  • 国家 KR

  • 入库时间 2022-08-21 17:51:46

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