首页> 外国专利> PLASMA ETCHING DEVICE AND ETCHING METHOD CAPABLE OF IMPROVING ETCHING UNIFORMITY IN THE CENTER AND OUTSIDE OF A SUBSTRATE

PLASMA ETCHING DEVICE AND ETCHING METHOD CAPABLE OF IMPROVING ETCHING UNIFORMITY IN THE CENTER AND OUTSIDE OF A SUBSTRATE

机译:能够提高基板中心和外部的刻蚀均匀性的等离子体刻蚀装置和刻蚀方法

摘要

PURPOSE: A plasma etching device and an etching method are provided to implement a uniform etching by decreasing the density of plasma gas particles supplied to the outer side of the substrate. ;CONSTITUTION: A chamber(110) provides an etching space. An electrostatic chuck(120) is received in a substrate loaded in the chamber. An upper electrode(130) generates plasma by applying a high frequency voltage to the chamber. A gas diffusing ring(170) supplies reactive gas to the chamber. A vacuum pump(150) is connected to the lower side of the chamber to provide vacuum to the chamber.;COPYRIGHT KIPO 2011
机译:目的:提供一种等离子体蚀刻装置和蚀刻方法,以通过降低供应到基板外侧的等离子体气体颗粒的密度来实现均匀蚀刻。 ;组成:腔室(110)提供蚀刻空间。静电吸盘(120)被接收在装载在腔室中的基板中。上电极(130)通过向腔室施加高频电压来产生等离子体。气体扩散环(170)向腔室供应反应气体。真空泵(150)连接到腔室的下侧以向腔室提供真空。; COPYRIGHT KIPO 2011

著录项

  • 公开/公告号KR20110077951A

    专利类型

  • 公开/公告日2011-07-07

    原文格式PDF

  • 申请/专利权人 HYNIX SEMICONDUCTOR INC.;

    申请/专利号KR20090134652

  • 发明设计人 JO SANG JIN;

    申请日2009-12-30

  • 分类号H01L21/3065;

  • 国家 KR

  • 入库时间 2022-08-21 17:51:32

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号