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PLASMA ETCHING DEVICE AND ETCHING METHOD CAPABLE OF IMPROVING ETCHING UNIFORMITY IN THE CENTER AND OUTSIDE OF A SUBSTRATE
PLASMA ETCHING DEVICE AND ETCHING METHOD CAPABLE OF IMPROVING ETCHING UNIFORMITY IN THE CENTER AND OUTSIDE OF A SUBSTRATE
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机译:能够提高基板中心和外部的刻蚀均匀性的等离子体刻蚀装置和刻蚀方法
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摘要
PURPOSE: A plasma etching device and an etching method are provided to implement a uniform etching by decreasing the density of plasma gas particles supplied to the outer side of the substrate. ;CONSTITUTION: A chamber(110) provides an etching space. An electrostatic chuck(120) is received in a substrate loaded in the chamber. An upper electrode(130) generates plasma by applying a high frequency voltage to the chamber. A gas diffusing ring(170) supplies reactive gas to the chamber. A vacuum pump(150) is connected to the lower side of the chamber to provide vacuum to the chamber.;COPYRIGHT KIPO 2011
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