CARRIER MODULE FOR A SEMICONDUCTOR DEVICE TEST HANDLER CAPABLE OF PREVENTING DAMAGE TO A SEMICONDUCTOR DEVICE DUE TO FOREIGN MATERIALS WHEN A SEMICONDUCTOR DEVICE IS TESTED

摘要

PURPOSE: A carrier module for a semiconductor device test handler is provided to naturally discharge foreign materials during a test without an automation process.;CONSTITUTION: A semiconductor device(3) is placed on a receiving surface(4) of a carrier(2) for a test handler. One escaping unit(6) is formed on a carrier to test the semiconductor device. Another escaping unit(5) discharges foreign materials from four corners.;COPYRIGHT KIPO 2012