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Portable Four-Point Probe for Sheet Resistance Measurement with the Dual Configuration Method

机译:便携式四点探头,采用双重配置方法测量薄层电阻

摘要

A portable four point probe for measuring sheet resistance using dual configuration method is provided to perform accurate measurement regardless of size, shape, and measurement position of a sample. A portable four point probe is contacted on a surface of a sample. After a current is supplied to outside two pins, a voltage is measured by inside two pins. A first resistance is calculated. After a current is supplied to a first pin and a third pin of the portable four point probe, a voltage is measured in a second pin and a fourth pin. A second resistance is calculated. A sheet resistance is calculated by the first resistance and the second resistance.
机译:提供了一种使用双配置方法测量薄层电阻的便携式四点探针,以执行精确的测量,而与样品的尺寸,形状和测量位置无关。便携式四点探针与样品表面接触。向两个外部引脚提供电流后,通过两个内部引脚测量电压。计算第一电阻。在将电流提供给便携式四点探针的第一引脚和第三引脚之后,在第二引脚和第四引脚中测量电压。计算第二电阻。由第一电阻和第二电阻计算薄层电阻。

著录项

  • 公开/公告号KR101020534B1

    专利类型

  • 公开/公告日2011-03-09

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20070084261

  • 发明设计人 강전홍;유광민;김한준;박영태;

    申请日2007-08-22

  • 分类号G01R1/073;

  • 国家 KR

  • 入库时间 2022-08-21 17:50:30

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