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Additive for chemically amplified photoresist composition and chemically amplified photoresist composition containing thereof

机译:用于化学放大的光致抗蚀剂组合物的添加剂和包含其的化学放大的光致抗蚀剂组合物

摘要

PURPOSE: An additive and a chemically amplified photoresist composition including thereof are provided to reduce a collapse of a pattern, and to maintain a width of the pattern during a process requiring a micro pattern for obtaining a uniform pattern. CONSTITUTION: An additive for chemically amplifying a photoresist composition contains a compound marked as chemical formula 1. In the chemical formula 1, R1 refers to -OH or -SH. R2~R4 are alkyl groups with the carbon number of 1~10. A chemically amplified photoresist composition includes the additive, a photoacid generator, and a photosensitive polymer. 0.1~20mol% of additive is contained in the composition. A formation method of a photo resist patter using the composition comprises a step of spraying the chemically amplified photoresist composition on the upper side of an etched layer.
机译:目的:提供添加剂和包括其的化学放大的光致抗蚀剂组合物,以减少图案的塌陷,并在需要微图案以获得均匀图案的过程中维持图案的宽度。组成:用于化学放大光致抗蚀剂组合物的添加剂包含标记为化学式1的化合物。在化学式1中,R1表示-OH或-SH。 R 2〜R 4为碳数为1〜10的烷基。化学放大的光致抗蚀剂组合物包括添加剂,光酸产生剂和光敏聚合物。组合物中包含0.1〜20mol%的添加剂。使用该组合物的光致抗蚀剂图案的形成方法包括以下步骤:将化学放大的光致抗蚀剂组合物喷涂在蚀刻层的上侧。

著录项

  • 公开/公告号KR101036753B1

    专利类型

  • 公开/公告日2011-05-24

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20080110599

  • 发明设计人 박찬식;

    申请日2008-11-07

  • 分类号G03F7/004;

  • 国家 KR

  • 入库时间 2022-08-21 17:50:16

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