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method and device for aligning substrate and the lotpastendruck druckschablone

机译:底物与drupastendruck druckschablone对准的方法和装置

摘要

The invention relates to a method and a device for aligning a substrate and a printing screen for printing said substrate with solder paste. Said method comprises the following steps: the first substrate is placed opposite the printing screen, at a distance therefrom; a first optical detection device is inserted between the printing side of the first substrate and the printing screen; position-defining first structures of the first structure and of the printing screen are detected by means of the first optical detection device; the first substrate and the printing screen are aligned on the basis of information obtained during the detection of the structures; reference data is detected from position-defining second structures on the side of the aligned substrate, opposing the printing side, by means of a second optical detection device; the first optical detection device is removed; the first substrate is removed and a second substrate is added opposite the printing screen; actual data is detected from position-defining second structures on the side of the second substrate, opposing the printing side, by means of the second optical detection device; and the second substrate and the printing screen are aligned on the basis of a comparison of reference data and actual data.
机译:本发明涉及一种用于对准基板的方法和装置以及用于用焊膏印刷所述基板的印刷丝网。所述方法包括以下步骤:将第一基板与印刷丝网相对放置,与印刷丝网保持一定距离;在第一基板的印刷面和印刷丝网之间插入第一光学检测装置。借助于第一光学检测装置来检测第一结构和印刷丝网的限定位置的第一结构。基于在结构检测期间获得的信息,将第一基板和印刷丝网对准;借助于第二光学检测装置从对准的基板的与印刷侧相对的一侧上的位置限定的第二结构中检测参考数据。去除第一光学检测装置;去除第一基板,并在印刷丝网的对面添加第二基板;通过第二光学检测装置从第二基板的与印刷侧相对的一侧的位置限定的第二结构检测实际数据。根据参考数据和实际数据的比较,将第二基板和印刷丝网对准。

著录项

  • 公开/公告号DE502004012088D1

    专利类型

  • 公开/公告日2011-02-17

    原文格式PDF

  • 申请/专利权人 EKRA EDUARD KRAFT GMBH;

    申请/专利号DE20045012088T

  • 发明设计人 HEYNEN ROLAND;

    申请日2004-03-12

  • 分类号H05K3/12;H05K1/02;H05K3;

  • 国家 DE

  • 入库时间 2022-08-21 17:46:51

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