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CLEANING LIQUID FOR CMP POLISHING LIQUID, CLEANING METHOD USING THE SAME, AND METHOD FOR MANUFACTURING SEMICONDUCTOR SUBSTRATE USING THE SAME
CLEANING LIQUID FOR CMP POLISHING LIQUID, CLEANING METHOD USING THE SAME, AND METHOD FOR MANUFACTURING SEMICONDUCTOR SUBSTRATE USING THE SAME
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机译:用于CMP抛光液的清洗液,使用该清洗液的清洗方法以及使用该清洗液的半导体基板的制造方法
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摘要
PROBLEM TO BE SOLVED: To provide a cleaning liquid for a CMP polishing liquid which suppresses deterioration of a polishing speed and can suppress the occurrence of a polishing scratch, and to provide a cleaning process using the same and a method for manufacturing a semiconductor substrate using the same.;SOLUTION: In the cleaning liquid for the CMP polishing liquid which cleans the feeding device of a CMP polishing liquid and contains a strong acid, the strong acid included in the cleaning liquid for the CMP polishing liquid is at least one compound selected from sulfuric acid, oxalic acid, hypochlorous acid, hydrofluoric acid, nitric acid and hydrochloric acid.;COPYRIGHT: (C)2012,JPO&INPIT
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