首页> 外国专利> CLEANING LIQUID FOR CMP POLISHING LIQUID, CLEANING METHOD USING THE SAME, AND METHOD FOR MANUFACTURING SEMICONDUCTOR SUBSTRATE USING THE SAME

CLEANING LIQUID FOR CMP POLISHING LIQUID, CLEANING METHOD USING THE SAME, AND METHOD FOR MANUFACTURING SEMICONDUCTOR SUBSTRATE USING THE SAME

机译:用于CMP抛光液的清洗液,使用该清洗液的清洗方法以及使用该清洗液的半导体基板的制造方法

摘要

PROBLEM TO BE SOLVED: To provide a cleaning liquid for a CMP polishing liquid which suppresses deterioration of a polishing speed and can suppress the occurrence of a polishing scratch, and to provide a cleaning process using the same and a method for manufacturing a semiconductor substrate using the same.;SOLUTION: In the cleaning liquid for the CMP polishing liquid which cleans the feeding device of a CMP polishing liquid and contains a strong acid, the strong acid included in the cleaning liquid for the CMP polishing liquid is at least one compound selected from sulfuric acid, oxalic acid, hypochlorous acid, hydrofluoric acid, nitric acid and hydrochloric acid.;COPYRIGHT: (C)2012,JPO&INPIT
机译:解决的问题:提供一种用于CMP抛光液的清洁液,该清洁液抑制抛光速度的恶化并且可以抑制抛光划痕的发生,并提供使用该清洁液的清洁工艺以及使用该清洁液的半导体基板的制造方法。解决方案:在用于清洁CMP抛光液进料装置并包含强酸的CMP抛光液清洁液中,用于CMP抛光液的清洁液中包含的强酸是至少一种选自以下的化合物从硫酸,草酸,次氯酸,氢氟酸,硝酸和盐酸中提取。;版权所有:(C)2012,日本特许会计师事务所

著录项

  • 公开/公告号JP2012134357A

    专利类型

  • 公开/公告日2012-07-12

    原文格式PDF

  • 申请/专利权人 HITACHI CHEM CO LTD;

    申请/专利号JP20100285803

  • 发明设计人 YOSHIKAWA SHIGERU;OTA MUNEHIRO;

    申请日2010-12-22

  • 分类号H01L21/304;B08B3/08;

  • 国家 JP

  • 入库时间 2022-08-21 17:44:39

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