首页> 外国专利> CLEANSING LIQUID COMPOSITION FOR SEMICONDUCTOR SUBSTRATE, METHOD OF MANUFACTURING THE CLEANING LIQUID COMPOSITION, CLEANSING METHOD OF SEMICONDUCTOR SUBSTRATE USING THE CLEANING LIQUID COMPOSITION, AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE COMPRISING THE CLEANSING METHOD

CLEANSING LIQUID COMPOSITION FOR SEMICONDUCTOR SUBSTRATE, METHOD OF MANUFACTURING THE CLEANING LIQUID COMPOSITION, CLEANSING METHOD OF SEMICONDUCTOR SUBSTRATE USING THE CLEANING LIQUID COMPOSITION, AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE COMPRISING THE CLEANSING METHOD

机译:用于半导体基质的清洁液体组合物,制造该清洁液体组合物的方法,使用该清洁液体组合物的半导体基质的清洁方法以及制造包括该清洁方法的半导体装置的方法

摘要

PROBLEM TO BE SOLVED: To provide means for removing polymer on a semiconductor substrate and/or a conductive structure without damaging the conductive structure and effectively suppressing particle pollution and metal pollution.;SOLUTION: A cleansing liquid composition for a semiconductor substrate comprises: 80 to 99.8999 mass% of water solution containing: ammonium hydroxide compound and fluorine containing compound; 0.1 to 5 mass% of buffer; and 0.0001 to 15 mass% of corrosion inhibitor. Also, disclosed are the method of manufacturing the cleansing liquid composition, the cleansing method of the semiconductor substrate using the cleansing liquid composition, and the method of manufacturing a semiconductor device comprising the cleansing method.;COPYRIGHT: (C)2007,JPO&INPIT
机译:解决的问题:提供一种在不损坏导电结构并有效抑制颗粒污染和金属污染的情况下去除半导体衬底和/或导电结构上的聚合物的方法。解决方案:半导体衬底的清洁液组合物包括:80至99.8999质量%的水溶液含有:氢氧化铵化合物和含氟化合物。 0.1-5质量%的缓冲液;和0.0001至15质量%的腐蚀抑制剂。还公开了制造清洁液组合物的方法,使用该清洁液组合物的半导体基板的清洁方法以及包括该清洁方法的半导体器件的制造方法。版权所有:(C)2007,JPO&INPIT

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