Being the device which measures the property of manner and the device null structure which measure the property of structure

摘要

Is related to an apparatus for measuring characteristics of the structure, the apparatus is adapted to output at a different wavelength of radiation, the present invention, a radiation generating means 1 for generating a second radiation probe and the first pump radiation When, the six detector means for detecting the second beam that passed through or reflected from the structure, generating a signal to be analyzed, generate a time offset between the second probe radiation and a first pump on the structure means 3 for, check the zone that processes a signal corresponding to the jump, it is determined as a function of different wavelengths and amplitudes of the jump, is compared with the amplitude change theoretical pattern of change in amplitude of the amplitude according to wavelength, the theoretical The comparison with the wavelength characteristic of the specific pattern, and a, and means 7 for determining a characteristic value relating to the radiation propagation speed in the structure and thickness of the structure.