首页> 外国专利> Photoresist removal for composition, method of manufacture photoresist removal for composition, photoresist removal method of using a photo resist removal for composition, and a method of manufacturing a semiconductor device

Photoresist removal for composition, method of manufacture photoresist removal for composition, photoresist removal method of using a photo resist removal for composition, and a method of manufacturing a semiconductor device

机译:用于组合物的光致抗蚀剂去除,用于组合物的光致抗蚀剂去除的制造方法,使用用于组合物的光致抗蚀剂去除的光致抗蚀剂的去除方法以及半导体器件的制造方法

摘要

PROBLEM TO BE SOLVED: To provide a composition for stripping a photoresist, the composition that can selectively stripping a photoresist and an etching residue while minimizing damages in metal wires and an oxide film.;SOLUTION: The composition for stripping a photoresist contains an alcohol amide compound expressed by structural formula 1 by 5 to 20 mass%, a polar aprotic solvent by 15 to 60 mass%, an additive by 0.1 to 6 mass% and water. By using the above composition, not only a photoresist and a fine etching residue can be effectively removed but damages on a metal wire exposed upon stripping the photoresist can be minimized. In structural formula 1, R1 represents a hydroxyl group or a hydroxyalkyl group, and R2 represents hydrogen or a hydroxyalkyl group.;COPYRIGHT: (C)2007,JPO&INPIT
机译:解决的问题:提供一种用于剥离光致抗蚀剂的组合物,该组合物可以选择性地剥离光致抗蚀剂和蚀刻残余物,同时最小化金属线和氧化膜中的损伤。;解决方案:用于剥离光致抗蚀剂的组合物包含醇酰胺。由结构式1表示的化合物为5至20质量%,极性非质子溶剂为15至60质量%,添加剂为0.1至6质量%和水。通过使用上述组合物,不仅可以有效地去除光致抗蚀剂和细微的蚀刻残留物,而且可以使在剥离光致抗蚀剂时露出的金属线上的损伤最小化。结构式1中,R 1 代表羟基或羟烷基,R 2 代表氢或羟烷基。; COPYRIGHT:(C)2007,JPO&INPIT

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号