METHOD, ELECTRIC CIRCUIT ARRANGEMENT AND ELECTRIC MEMORY UNIT FOR DETERMINING A CHARACTERISTIC STATUS PARAMETER OF THE MEMORY UNIT

摘要

The invention relates to a method for determining a characteristic status parameter of a memory unit via an electric circuit arrangement. In the circuit arrangement at least one inductive component and at least one capacitive component are arranged, forming a tuned circuit with the memory unit. The method has the following steps of energizing the tend circuit by temporary charging of the capacitive component, the energizing being carried out by an energizing device electrically supplied by the memory unit, and determining a time-dependent voltage change at the capacitive component after terminating the energizing and determining the characteristic status parameter from the time-dependence of the voltage change. The invention further relates to a corresponding electrical circuit arrangement and an electrical memory, including such a circuit arrangement.