首页>
外国专利>
Large-surface defect detection by single-frame spatial-carrier interferometry
Large-surface defect detection by single-frame spatial-carrier interferometry
展开▼
机译:单帧空间载波干涉法检测大表面缺陷
展开▼
页面导航
摘要
著录项
相似文献
摘要
An adaptive algorithm is tailored to fit the local fringe frequency of single-frame spatial-carrier data under analysis. Each set of data points used sequentially by the algorithm is first processed with a Fourier Transform to find the local frequency of the fringes being analyzed. That information is then used to adapt the algorithm to the correct phase step thus calculated, thereby optimizing the efficiency and precision with which the algorithm profiles the local surface area. As a result, defects are identified and measured with precision even when the slope of the surface varies locally to the point where the algorithm without adaptive modification would not be effective to measure them. Once so identified, the defects may be measured again locally with greater accuracy by conventional temporal PSI.
展开▼