首页> 美国政府科技报告 >Use of Holographic Fringe Linearization Interferometry (FLI) for Detection of Defects
【24h】

Use of Holographic Fringe Linearization Interferometry (FLI) for Detection of Defects

机译:使用全息条纹线性干涉测量法(FLI)检测缺陷

获取原文

摘要

This final report shows that the two-exposure FLI holographic method is feasible. We describe how the two-exposure FLI technique can be utilized by increasing the linear fringe frequency. Reprints of the published papers from this contract describing the modeling/experiment program are appended. The feasibility of an automatic readout for the linear fringe method is demonstrated by showing that observable and measureable effects at the defect site can be monitored. The sensitivity analysis and results from a simple dynamic loading model are presented. A preliminary FLI experiment on composite samples with both static and thermal loading failed to find defects. Finally, recommendations of work necessary to develop the FLI technique are given. Keywords: Holographic interferometry; Non destructive evaluation; Lasers; Moire techniques; Finite element analyses.

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号