Defect Detection of Electronic Circuit Using Digital Holographic Interferometry

摘要

Digital holographic interferometry has been implemented for inspection of defect in an electronic circuit. A simulated defect using Joule's law of heating has been used. Temperature profile on the surface of the defect has been obtained using the digital holographic interferometry. Abel inversion and Lorentz-Lorentz equation have been used for relating the temperature to the reconstructed phase. Goldstein phase unwrapping algorithm has been implemented to obtain continuous variation of the phase distribution over the defect. Experiments are conducted on the electronic circuit. This paper presents the experimental investigation of defect produced in electronic circuit using the hologram reconstruction, two dimensional Goldstein phase unwrapping method, Abel inversion and Lorentz-Lorentz equation.