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Methodology to enable wafer result prediction of semiconductor wafer batch processing equipment
Methodology to enable wafer result prediction of semiconductor wafer batch processing equipment
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机译:预测半导体晶圆批处理设备的晶圆结果的方法
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摘要
A method to enable wafer result prediction from a batch processing tool, includes collecting manufacturing data from a batch of wafers processed in batch in the batch processing tool, to form a batch processing resu defining a degree of freedom of the batch processing result based on the manufacturing data; and performing an optimal curve fitting by trial and error for an optimal function model of the batch processing result based on the batch processing result.
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