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Low cost testing and sorting for integrated circuits
Low cost testing and sorting for integrated circuits
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机译:集成电路的低成本测试和分类
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摘要
Methods of testing and sorting integrated circuits in clusters are disclosed. Each cluster has power and data terminals connected to common power and data busses providing a common power supply. Each integrated circuit has a first non-volatile memory storing an activation code and a second programmable non-volatile memory that is capable of storing the activation code. If an integrated circuit passes testing, the activation code stored in the first non-volatile memory is written into the second non-volatile memory. An integrated circuit is independently functional upon separation from the cluster if the codes in the first and second non-volatile memories match. Upon separation, integrated circuits are queried to determine which respond. Each integrated circuit includes logic adapted to determine whether the codes in the first and second non-volatile memories match. If the codes do not match, the logic permanently disables the integrated circuit upon separation from the cluster.
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