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SINGLE EVENT UPSET TEST CIRCUIT AND METHODOLOGY
SINGLE EVENT UPSET TEST CIRCUIT AND METHODOLOGY
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机译:单事件上测试电路和方法
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摘要
A method, involving: inputting an initial data pattern into a scan chain circuit of an integrated circuit device; applying a particle beam to the integrated circuit device, while driving the scan chain circuit with a clock signal, to generate an output data pattern; and generating a single event upset error rate test result based on a comparison between the output data pattern and the initial data pattern.
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