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APPARATUS AND METHOD FOR MEASURING THE DISPERSION DEGREE OF A NANO MATERIAL

机译:测量纳米材料色散度的装置和方法

摘要

PURPOSE: An apparatus and a method for measuring the dispersion degree of a nano material are provided to measure permittivity or permeability from the scattering coefficient of a nano material.;CONSTITUTION: An apparatus(100) for measuring the dispersion degree of a nano material comprises a network analyzer(10), a transmission unit(20), a receiving unit(30), a nano-material sample(40), and a processing unit(50). The network analyzer produces an electromagnetic signal and calculates a scattering coefficient from the permeability and reflectivity of the electromagnetic signal. The transmission unit applies the electromagnetic signal to a target object. The receiving unit receives the electromagnetic signal passing through the target object. The nano-material sample is located between the transmission and receiving units. The processing unit receives the scattering coefficient from the network analyzer and calculates the dispersion degree of the nano-material sample.;COPYRIGHT KIPO 2012
机译:目的:提供一种用于测量纳米材料的分散度的装置和方法,以根据纳米材料的散射系数来测量介电常数或磁导率。;构成:一种用于测量纳米材料的分散度的装置(100),其包括:网络分析器(10),发送单元(20),接收单元(30),纳米材料样本(40)和处理单元(50)。网络分析仪产生电磁信号,并根据电磁信号的磁导率和反射率计算散射系数。传输单元将电磁信号施加到目标物体。接收单元接收穿过目标物体的电磁信号。纳米材料样品位于发射和接收单元之间。处理单元从网络分析仪接收散射系数,并计算纳米材料样品的分散度。; COPYRIGHT KIPO 2012

著录项

  • 公开/公告号KR20120003762A

    专利类型

  • 公开/公告日2012-01-11

    原文格式PDF

  • 申请/专利权人 AGENCY FOR DEFENSE DEVELOPMENT;

    申请/专利号KR20100064543

  • 发明设计人 SEO IL SUNG;

    申请日2010-07-05

  • 分类号G01N15/00;G01N23/02;B82B1/00;

  • 国家 KR

  • 入库时间 2022-08-21 17:10:47

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