首页> 外国专利> METHOD FOR FABRICATING A SEMICONDUCTOR DEVICE, CAPABLE OF USING A RESISTANCE FILM INCLUDING A PLURALITY OF OXYGEN VACANCIES

METHOD FOR FABRICATING A SEMICONDUCTOR DEVICE, CAPABLE OF USING A RESISTANCE FILM INCLUDING A PLURALITY OF OXYGEN VACANCIES

机译:一种制造半导体设备的方法,该方法可使用包含多个氧气空位的电阻膜

摘要

PURPOSE: A method for fabricating a semiconductor device is provided to reduce a process time and improve productivity by forming a resistance film having a variable resistance property.;CONSTITUTION: In a method for fabricating a semiconductor device, a metal layer is formed on a bottom electrode(21). An oxygen is ion-implanted in the metal layer(101). A thermal process is performed to change a metal layer(22A) into a resistor film. The resistor film comprises a plurality of oxygen vacancies A top electrode is formed on the resistor film.;COPYRIGHT KIPO 2012
机译:目的:提供一种用于制造半导体器件的方法,以通过形成具有可变电阻特性的电阻膜来减少工艺时间并提高生产率。组成:在制造半导体器件的方法中,在底部上形成金属层电极(21)。将氧离子注入到金属层(101)中。进行热处理以将金属层(22A)改变为电阻器膜。电阻器膜包含多个氧空位。在电阻器膜上形成顶部电极。; COPYRIGHT KIPO 2012

著录项

  • 公开/公告号KR20120004826A

    专利类型

  • 公开/公告日2012-01-13

    原文格式PDF

  • 申请/专利权人 HYNIX SEMICONDUCTOR INC.;

    申请/专利号KR20100065513

  • 发明设计人 JU MIN AE;

    申请日2010-07-07

  • 分类号H01L21/8247;H01L27/115;

  • 国家 KR

  • 入库时间 2022-08-21 17:10:45

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