首页> 外国专利> MAGNETIC RANDOM ACCESS MEMORY CIRCUIT CAPABLE OF MAXIMIZING YIELD OF AN MRAM BY PROGRAMMING, TESTING, AND CLASSIFYING MAGNETIC MEMORY DIES OR CHIPS

MAGNETIC RANDOM ACCESS MEMORY CIRCUIT CAPABLE OF MAXIMIZING YIELD OF AN MRAM BY PROGRAMMING, TESTING, AND CLASSIFYING MAGNETIC MEMORY DIES OR CHIPS

机译:通过对磁性存储器芯片或芯片进行编程,测试和分类,可以最大程度地提高内存产量的磁性随机访问存储器电路

摘要

PURPOSE: A magnetic random access memory circuit is provided to program all cells by controlling programming currents with regard to each byte and prevent a memory cell from disturbing other cells.;CONSTITUTION: An initial nominal row programming current, an IR, an initial nominal column programming current, an IC are set(710). All magnetic memory array cells are recorded(720). All magnetic memory array cells are read again and are compared with the recorded cell values(730). If all comparisons between the read memory cell data and the recorded memory cell data pass, the IR and the IC are locked or fixed(740). A die with high quality is signaled(750). If the comparison between the read memory cell data and the recorded memory cell data fails(760), column or row programming currents are changed until all effective IC+IR combinations are tried(770). A defective die is signaled(780).;COPYRIGHT KIPO 2012
机译:目的:提供一个磁性随机存取存储器电路,通过控制每个字节的编程电流来编程所有单元,并防止存储单元干扰其他单元。组成:初始标称行编程电流,IR,初始标称列编程电流,设置IC(710)。记录所有磁存储阵列单元(720)。再次读取所有磁存储阵列单元,并将其与记录的单元值进行比较(730)。如果读取的存储单元数据和记录的存储单元数据之间的所有比较都通过,则IR和IC被锁定或固定(7​​40)。发出高质量的模具信号(750)。如果读取的存储单元数据与记录的存储单元数据之间的比较失败(760),则改变列或行编程电流,直到尝试了所有有效的IC + IR组合(770)。有缺陷的模具发出信号(780).; COPYRIGHT KIPO 2012

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号