首页> 外国专利> APPARATUS FOR INSPECTING A LIGHT EMITTING DIODE PACKAGE ARRAY AND A METHOD FOR INSPECTING THE SAME CAPABLE OF STANDARDIZING THE COLOR CHARACTERISTIC OF THE LIGHT EMITTING DIODE PACKAGE ARRAY

APPARATUS FOR INSPECTING A LIGHT EMITTING DIODE PACKAGE ARRAY AND A METHOD FOR INSPECTING THE SAME CAPABLE OF STANDARDIZING THE COLOR CHARACTERISTIC OF THE LIGHT EMITTING DIODE PACKAGE ARRAY

机译:用于检测发光二极管封装阵列的装置和用于对具有相同能力的发光二极管封装阵列的颜色特征进行标准化的方法

摘要

PURPOSE: An apparatus for inspecting a light emitting diode package array and a method for inspecting the same are provided to inspect minute difference of brightness or color temperatures in the light emitting diode package.;CONSTITUTION: An apparatus for inspecting a light emitting diode package includes a sheet and a jig. The sheet includes a plurality of holes and sheet paper(110a). The holes correspond to a light emitting diode package array. The jig fixes the edge of the sheet paper. The sheet paper is capable of being attached or detached to/from the jig. The apparatus easily discover the abnormality of brightness or color temperatures from a part of light emitting diode packages in the light emitting diode package array.;COPYRIGHT KIPO 2012
机译:目的:提供了一种用于检查发光二极管封装阵列的设备及其检查方法,以检查在发光二极管封装中的亮度或色温的微小差异。构成:一种用于检查发光二极管封装的设备包括:一张纸和一个夹具。该片材包括多个孔和片材纸(110a)。孔对应于发光二极管封装阵列。夹具固定单页纸的边缘。该单张纸能够与夹具连接或从夹具上拆下。该设备可以从发光二极管封装阵列中的一部分发光二极管封装轻松发现亮度或色温异常。; COPYRIGHT KIPO 2012

著录项

  • 公开/公告号KR20120045404A

    专利类型

  • 公开/公告日2012-05-09

    原文格式PDF

  • 申请/专利权人 LG INNOTEK CO. LTD.;

    申请/专利号KR20100106919

  • 发明设计人 KIM MIN CHUL;

    申请日2010-10-29

  • 分类号G01R31/265;

  • 国家 KR

  • 入库时间 2022-08-21 17:10:06

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