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APPARATUS FOR INSPECTING LIGHT EMITTING DIODE PACKAGES CAPABLE OF SCRAPPING BAD LIGHT EMITTING DIODE PACKAGES AFTER AN INSPECTING PROCESS
APPARATUS FOR INSPECTING LIGHT EMITTING DIODE PACKAGES CAPABLE OF SCRAPPING BAD LIGHT EMITTING DIODE PACKAGES AFTER AN INSPECTING PROCESS
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机译:用于在检查过程之后检查可刮除坏的发光二极管封装的发光二极管封装的装置
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摘要
PURPOSE: An apparatus for inspecting light emitting diode packages is provided to rapidly implement an inspecting process and a scrapping process with respect to bad light emitting diode packages. ;CONSTITUTION: A loading part(110) loads the array type group of light emitting diode packages into a cassette. An inspecting part(120) inspects defects in the light emitting diode packages through a visual inspecting process. An unloading part(150) loads a vacant cassette in order to receive the group of the light emitting diode packages. A rejecting part(140) punches and scraps bad light emitting diode packages.;COPYRIGHT KIPO 2011
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