首页> 外国专利> APPARATUS FOR INSPECTING LIGHT EMITTING DIODE PACKAGES CAPABLE OF SCRAPPING BAD LIGHT EMITTING DIODE PACKAGES AFTER AN INSPECTING PROCESS

APPARATUS FOR INSPECTING LIGHT EMITTING DIODE PACKAGES CAPABLE OF SCRAPPING BAD LIGHT EMITTING DIODE PACKAGES AFTER AN INSPECTING PROCESS

机译:用于在检查过程之后检查可刮除坏的发光二极管封装的发光二极管封装的装置

摘要

PURPOSE: An apparatus for inspecting light emitting diode packages is provided to rapidly implement an inspecting process and a scrapping process with respect to bad light emitting diode packages. ;CONSTITUTION: A loading part(110) loads the array type group of light emitting diode packages into a cassette. An inspecting part(120) inspects defects in the light emitting diode packages through a visual inspecting process. An unloading part(150) loads a vacant cassette in order to receive the group of the light emitting diode packages. A rejecting part(140) punches and scraps bad light emitting diode packages.;COPYRIGHT KIPO 2011
机译:目的:提供一种用于检查发光二极管封装的设备,以针对不良的发光二极管封装快速执行检查过程和报废过程。 ;组成:装载部件(110)将发光二极管封装的阵列类型组装载到暗盒中。检查部分(120)通过视觉检查过程检查发光二极管封装中的缺陷。卸载部分(150)装载空盒以接收该组发光二极管封装。剔除零件(140)冲压并报废不良的发光二极管封装。; COPYRIGHT KIPO 2011

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