首页> 外国专利> PHOTO-MASK AND A METHOD FOR MANUFACTURING THE SAME CAPABLE OF IMPROVING THE RESOLUTION OF PATTERNS BY INCLUDING A FIRST LIGHT SHIELDING PATTERN AND A SECOND LIGHT SHIELDING PATTERN RESPECTIVELY FORMED IN THE BLIND REGION AND THE PATTERN REGION OF A TRANSPARENT SUBSTRATE

PHOTO-MASK AND A METHOD FOR MANUFACTURING THE SAME CAPABLE OF IMPROVING THE RESOLUTION OF PATTERNS BY INCLUDING A FIRST LIGHT SHIELDING PATTERN AND A SECOND LIGHT SHIELDING PATTERN RESPECTIVELY FORMED IN THE BLIND REGION AND THE PATTERN REGION OF A TRANSPARENT SUBSTRATE

机译:通过包括透明底物的盲区和图案区中分别形成的第一光屏蔽图案和第二光屏蔽图案来制造能够改善图案分辨率的相同能力的光掩膜和方法

摘要

PURPOSE: A photo-mask and a method for manufacturing the same are provided to reduce the thickness of a light shielding pattern in a pattern region and to secure optical density by constantly keeping the thickness of a light shielding pattern in a blind region.;CONSTITUTION: A photo-mask(100) includes a photo-mask substrate, a first light shielding pattern(124) of a first thickness and a second light shielding pattern(126). The photo-mask substrate includes a pattern region(P) and a blind region(B). The fist light shielding pattern is formed in the blind region. The second light shielding pattern is formed in the pattern region. The second thickness of the second light shielding pattern is thinner than the first thickness of the first light shielding pattern. The patterns are based on the same material.;COPYRIGHT KIPO 2012
机译:目的:提供一种光掩模及其制造方法,以减小图案区域中的遮光图案的厚度,并通过将遮光图案的厚度始终保持在盲区中来确保光密度。 :光掩模(100)包括光掩模基板,具有第一厚度的第一遮光图案(124)和第二遮光图案(126)。光掩模基板包括图案区域(P)和盲区(B)。第一遮光图案形成在盲区中。在图案区域中形成第二遮光图案。第二遮光图案的第二厚度比第一遮光图案的第一厚度薄。这些模式基于相同的材料。; COPYRIGHT KIPO 2012

著录项

  • 公开/公告号KR20120068998A

    专利类型

  • 公开/公告日2012-06-28

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号KR20100102587

  • 发明设计人 JANG IL YONG;KIM BYUNG GOOK;

    申请日2010-10-20

  • 分类号G03F1/54;H01L21/027;

  • 国家 KR

  • 入库时间 2022-08-21 17:09:42

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