首页> 外国专利> NEAR INFRARED SPECTRAL ANALYSIS DEVICE OF AN OBJECT NON-DESTRUCTIVE MODE FOR GRASPING PHYSICOCHEMICAL PROPERTIES OF A MEASUREMENT OBJECT WITHOUT DESTROYING THE MEASUREMENT OBJECT BY USING THE NEAR INFRARED RAYS

NEAR INFRARED SPECTRAL ANALYSIS DEVICE OF AN OBJECT NON-DESTRUCTIVE MODE FOR GRASPING PHYSICOCHEMICAL PROPERTIES OF A MEASUREMENT OBJECT WITHOUT DESTROYING THE MEASUREMENT OBJECT BY USING THE NEAR INFRARED RAYS

机译:物体的非破坏性模式的近红外光谱分析装置,用于捕获测量对象的物理化学特性,而不会通过使用近红外射线破坏测量对象

摘要

PURPOSE: A near infrared spectral analysis device of an object non-destructive mode is provided to measure an near infrared spectrum of a measurement object which accuracy is excellent and to establish databases by using physical properties and the percentage of water content or the acidity of the measurement object.;CONSTITUTION: A near infrared spectral analysis device of an object non-destructive mode comprises a light source, an integrating sphere, a near infrared spectral analysis device(10), an outer case(20), a pedestal(30), a reference substance(40), a data process storing device, and a user interface. The light source emits the near infrared rays. The integrating sphere comprises an incident port, a measurement port(13), and a discharging port. The incident port becomes incident to the inside of the integrating sphere. The measurement port irradiates the near infrared rays became incident to the incident port and receives the near infrared rays reflected by the measurement object. The discharging port discharges optical signals of the measurement object diffused and reflected in the inner circumference of the integrating sphere by being reflected by the measurement object. The near infrared spectral analysis device measures the discharged optical signals, thereby generating spectrum data of the measurement object. The reference substance comprises total reflection materials. The total reflection materials reflect the near infrared rays penetrated through the measurement object among the near infrared rays irradiated to the measurement object from the measurement port.;COPYRIGHT KIPO 2012
机译:目的:提供一种物体无损模式的近红外光谱分析装置,用于测量精度极高的被测物体的近红外光谱,并通过使用物理性质和水的百分比或酸度建立数据库。组成:一种物体无损模式的近红外光谱分析装置,包括光源,积分球,近红外光谱分析装置(10),外壳(20),基座(30) ,参考物质(40),数据处理存储设备和用户界面。光源发出近红外线。积分球包括入射口,测量口(13)和排出口。入射端口入射到积分球的内部。测量端口照射入射到入射端口的近红外线,并接收被测量对象反射的近红外线。排出口使在积分球的内周扩散并反射的被测量物的光信号被被测量物反射。近红外光谱分析装置测量释放的光信号,从而产生测量对象的光谱数据。参考物质包括全反射材料。全反射材料反射从测量端口照射到测量对象的近红外线中穿过测量对象的近红外线。; COPYRIGHT KIPO 2012

著录项

  • 公开/公告号KR20120075907A

    专利类型

  • 公开/公告日2012-07-09

    原文格式PDF

  • 申请/专利权人 BRUKER OPTICS KOREA CO. LTD.;

    申请/专利号KR20100137814

  • 发明设计人 KIM HYO JIN;LEE JONG GOO;YI SUNG UK;

    申请日2010-12-29

  • 分类号G01N21/35;G01J1/02;

  • 国家 KR

  • 入库时间 2022-08-21 17:09:37

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