首页> 外国专利> NOVEL DOUBLE HBT-BASED CAPACITORLESS 1T DRAM CELL WITH SI/SIGE HETERO JUNCTIONS THROUGH THE SOURCE AND DRAIN OF A SILICON MATERIAL

NOVEL DOUBLE HBT-BASED CAPACITORLESS 1T DRAM CELL WITH SI/SIGE HETERO JUNCTIONS THROUGH THE SOURCE AND DRAIN OF A SILICON MATERIAL

机译:通过硅材料的源和漏,具有基于SI / SIGE异质结的基于HBT的新型双电容1T DRAM单元

摘要

PURPOSE: A novel double HBT-based capacitorless 1t dram cell with Si/SiGE hetero junctions is provided to improve carrier production rate by forming a hetero structure which is divided into the upper part and lower part of a body.;CONSTITUTION: A body(110) of a vertical pin type is formed on a substrate(100). The body is formed by using silicon-germanium. The source(120) and drain(130) of a silicon material are formed in right and left sides of the longitudinal direction of the body. A top gate(140) and a bottom gate(150) of a double structure are formed in the top and bottom of the body. A spacer(170) isolates the top gate, the bottom gate, the source and the drain.;COPYRIGHT KIPO 2012
机译:用途:一种新颖的基于HBT的双无电容器1t dram电池,具有Si / SiGE异质结,可通过形成被划分为主体上部和下部的异质结构来提高载流子生产率。在衬底(100)上形成垂直销型的垂直销110)。该主体通过使用硅锗形成。硅材料的源极(120)和漏极(130)形成在主体的纵向的右侧和左侧。在主体的顶部和底部形成双重结构的顶门(140)和底门(150)。隔离物(170)隔离顶栅,底栅,源极和漏极。; COPYRIGHT KIPO 2012

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