Method for determining characteristic of photovoltaic device with e.g. thin film solar cell, involves measuring characteristics of reference cells and solar cells with sun simulator for determining characteristics of solar cells

摘要

The method involves manufacturing reference cells for partial top and bottom cells (1, 2). Intrinsic layers (i1, i2) of one of the partial cells of multi-junction solar cells are converted into an electrically conductive layer by doping process. Spectral sensitivity of the reference cells is measured, and characteristics of the reference cells and multi-junction solar cells are measured with sun simulator i.e. xenon flash lamp, under same conditions for determining the characteristics of the multi-junction solar cells. The sun simulator is calibrated in the reference cells. An independent claim is also included for a reference module for performing a method for determining a characteristic of a photovoltaic device, comprising an intrinsic layer.