Method for determining component properties e.g. current-voltage characteristics in thin-film solar cells, involves exposing stack of cells to combined illumination light of solar simulator and selective excitation light components

摘要

The method involves exposing the monolithically deposited stack (C) of thin-film solar cells to a combined illumination light of a solar simulator light component (SL) and selective excitation light components (L1,L2) of intensity-controlled light sources (3,5). The current-voltage characteristic of the stack is then directly measured. The component characteristic or parameter of the selected cells (C1,C2) is determined from the measurement result. An independent claim is included for measuring arrangement for determination of component properties in thin-film solar cells.