Boundary scan test device for embedded substrate, has test controller that controls test chip to perform boundary scan test at semiconductor chip embedded into embedded substrate

摘要

The device has a test chip (2) which performs a boundary scan test at the to-be-tested semiconductor chip embedded into the embedded substrate (1). A test controller (3) controls the test chip to perform the boundary scan test at the semiconductor chip embedded into the embedded substrate. An independent claim is included for boundary scan test method.