首页> 外国专利> Half-tone type EUV mask, a method for producing half-tone type EUV mask, half-tone type EUV mask blank and pattern transfer method

Half-tone type EUV mask, a method for producing half-tone type EUV mask, half-tone type EUV mask blank and pattern transfer method

机译:半色调型EUV掩模,半色调型EUV掩模的制造方法,半色调型EUV掩模的坯料及图案转印方法

摘要

PPROBLEM TO BE SOLVED: To provide a halftone type EUV (Extreme Ultra Violet) mask, a halftone type EUV mask manufacturing method, a halftone type EUV mask blank and a pattern transfer method simultaneously attaining wide selectiveness (high degree of freedom) of reflectance and high resistance to cleaning solvent with a relatively thin thickness and selecting the material and the structure of an easy-to-etch halftone film. PSOLUTION: The halftone type EUV mask includes a substrate, a high reflection part formed on the substrate and a low reflection part formed on the substrate and patterned. The low reflection part is a laminate of a Ta (tantalum) containing first layer and an Ru (ruthenium) containing second layer. PCOPYRIGHT: (C)2010,JPO&INPIT
机译:

要解决的问题:提供一种半色调型EUV(极紫外)掩模,半色调型EUV掩模制造方法,半色调型EUV掩模坯料和图案转印方法,同时实现宽选择性(高自由度)具有相对薄的厚度的反射率和对清洁溶剂的高耐受性,并选择易于蚀刻的半色调膜的材料和结构。

解决方案:半色调型EUV掩模包括基板,形成在基板上的高反射部分和形成在基板上并被构图的低反射部分。低反射部分是包含Ta(钽)的第一层和包含Ru(钌)的第二层的层压体。

版权:(C)2010,日本特许厅&INPIT

著录项

  • 公开/公告号JP5282507B2

    专利类型

  • 公开/公告日2013-09-04

    原文格式PDF

  • 申请/专利权人 凸版印刷株式会社;

    申请/专利号JP20080246854

  • 发明设计人 松尾 正;

    申请日2008-09-25

  • 分类号H01L21/027;G03F1/24;G03F1/32;

  • 国家 JP

  • 入库时间 2022-08-21 16:54:49

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