首页> 外国专利> Scanning charged particle beam apparatus and chromatic spherical aberration correction method

Scanning charged particle beam apparatus and chromatic spherical aberration correction method

机译:扫描带电粒子束装置和色球差校正方法

摘要

In tilt observation with a scanning charged particle beam apparatus equipped with an aberration corrector, resolution reduction due to chromatic spherical aberration is suppressed regardless of a specific optical system. The control unit of the scanning charged particle beam apparatus provides a method for measuring chromatic spherical aberration in the tilt observation of the sample, and further has a chromatic aberration control function in the tilt observation of the sample. In order to suppress blurring of the image that occurs in the direction parallel to the sample surface due to chromatic spherical aberration and chromatic aberration at an inclination angle (-t1) that is axially symmetric with the chromatic aberration control function, the chromatic aberration control function prevents chromatic aberration from being zero. Control to be positive or negative.
机译:在配备有像差校正器的扫描带电粒子束装置的倾斜观察中,与特定的光学系统无关,都抑制了由于色球差引起的分辨率降低。扫描带电粒子束装置的控制单元提供一种用于在样品的倾斜观察中测量色球差的方法,并且还具有在样品的倾斜观察中的色差控制功能。为了抑制由于色球差和以与色差控制功能轴向对称的倾斜角(-t1)引起的色差,在平行于样品表面的方向上出现的图像模糊,色差控制功能防止色差为零。控制是正面还是负面。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号