首页> 外文期刊>Journal of Electron Microscopy >Electrostatic correction of the chromatic and of the spherical aberration of charged-particle lenses (part I).
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Electrostatic correction of the chromatic and of the spherical aberration of charged-particle lenses (part I).

机译:带电粒子透镜的色谱和球面像差的静电校正(第一部分)。

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摘要

A feasible electrostatic corrector (ECO) is outlined and the principle of the electrostatic correction is elucidated by means of a light-optical analogue. The ECO compensates for the chromatic and the spherical aberration of charged-particle lenses and reduces the resolution limit of a special LVSEM (low-voltage scanning electron microscope) from 6 nm to 1.4 nm. The geometry of the electrodes of the corrector is optimized with respect to the chromatic correction, the maximum strength of the electric field, and the residual higher-order aberrations which limit the resolution. In addition the stability criteria of the electric power supplies are discussed in detail.
机译:概述了可行的静电校正器(ECO),通过光光学模拟阐明静电校正的原理。 ECO补偿了带电粒子透镜的色谱和球面像差,并降低了从6nm至1.4nm的特殊LVSEM(低压扫描电子显微镜)的分辨率极限。 相对于校正,电场的最大强度以及限制分辨率的剩余高阶像差,优化了校正电极的几何形状。 另外,详细讨论了电力供应的稳定标准。

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