首页> 外文期刊>Journal of Electron Microscopy >Electrostatic correction of the chromatic and of the spherical aberration of charged-particle lenses (part II).
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Electrostatic correction of the chromatic and of the spherical aberration of charged-particle lenses (part II).

机译:带电粒子透镜的色差和球差的静电校正(第二部分)。

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摘要

A doubly symmetric electrostatic corrector which compensates for the axial chromatic and the axial third-order aberration of charged-particle lenses is outlined. Due to the double symmetry the corrector does not introduce linear off-axis aberrations and yields in combination with a round objective lens an electron-optical aplanat. The principle of the electrostatic correction of the axial chromatic aberration is explained in mathematical terms. The geometry of the electrodes of a suitable corrector is optimized with respect to the chromatic correction, the maximum strength of the electric field, and the residual higher-order aberrations which limit the resolution. The resulting aplanat achieves a resolution limit of about 2 nm for an image field with a diameter of 1500 nm. The required stabilities of the electric power supplies are discussed in detail.
机译:概述了用于补偿带电粒子透镜的轴向色度和轴向三阶像差的双对称静电校正器。由于具有双重对称性,校正器不会引入线性离轴像差,并且与圆形物镜结合时不会产生电子-光学平面透镜。用数学术语解释了轴向色差的静电校正原理。相对于色度校正,电场的最大强度以及限制分辨率的残余高阶像差,优化了合适校正器的电极的几何形状。对于直径为1500 nm的像场,所得的扁平透镜实现了约2 nm的分辨率极限。详细讨论了电源的所需稳定性。

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