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Magnetic Random Access Memory (MRAM) Manufacturing Process for a Small Magnetic Tunnel Junction (MTJ) Design with a Low Programming Current Requirement

机译:具有低编程电流要求的小型磁性隧道结(MTJ)设计的磁性随机存取存储器(MRAM)制造工艺

摘要

A method of making a magnetic random access memory cell includes forming a magnetic tunnel junction (MTJ) on top of a wafer, depositing oxide on top of the MTJ, depositing a photo-resist layer on top of the oxide layer, forming a trench in the photo-resist layer and oxide layer where the trench has a width that is substantially the same as that of the MTJ. Then, the photo-resist layer is removed and a hard mask layer is deposited on top of the oxide layer in the trench and the wafer is planarized to remove the portion of the hard mask layer that is not in the trench to substantially level the top of oxide layer and the hard layer on the wafer. The remaining oxide layer is etched and the MTJ is etched to remove the portion of the MTJ which is not covered by the hard mask layer.
机译:一种制造磁性随机存取存储单元的方法,包括在晶片顶部形成磁性隧道结(MTJ),在MTJ顶部沉积氧化物,在氧化物层顶部沉积光致抗蚀剂层,在其中形成沟槽。所述光致抗蚀剂层和氧化物层,其中所述沟槽具有与所述MTJ的宽度基本相同的宽度。然后,去除光致抗蚀剂层,并且在沟槽中的氧化物层的顶部上沉积硬掩模层,并且对晶片进行平坦化,以去除不在沟槽中的硬掩模层的部分以使顶部基本平坦。晶片上的氧化物层和硬质层的厚度。蚀刻剩余的氧化物层并且蚀刻MTJ以去除MTJ的未被硬掩模层覆盖的部分。

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