An integrated circuit having charged-device model (CDM) electrostatic discharge (ESD) protection includes an I/O circuit, at least one CDM ESD protection device, and at least one internal circuit. The integrated circuit further includes at least one TSV (Through Silicon Via) each being coupled between a ground of at least one ground of the input/output circuit and one of the at least one ESD protection device, wherein each of the at least one ESD protection device is coupled between one of the at least one TSV and a ground of one of the at least one internal circuit.
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