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Optical proximity correction aware integrated circuit design optimization

机译:具有光学接近校正功能的集成电路设计优化

摘要

An EDA method is implemented for modifying a layout file after place and route. The method includes storing a library of shape modifications for cells in the design library used for implementation of the circuit. The library of shape modifications includes the results of process-specific calibration of the shape modifications which indicate adjustment of a circuit parameter caused by applying the shape modifications to the cells. The layout file is analyzed to identify a cell for adjustment of the circuit parameter. A shape modification calibrated to achieve the desired adjustment is selected from the library. The shape modification is applied to the identified cell in the layout file to produce a modified layout file. The modified layout file can be used for tape out, and subsequently for manufacturing of an improved integrated circuit.
机译:实现了EDA方法,用于在布局和布线后修改布局文件。该方法包括在用于电路实现的设计库中存储单元的形状修改库。形状修改库包括形状修改的特定于工艺的校准结果,这些结果指示通过将形状修改应用于单元而导致的电路参数的调整。分析布局文件以识别用于调整电路参数的单元。从库中选择已校准以实现所需调整的形状修改。形状修改将应用于布局文件中标识的单元,以生成修改后的布局文件。修改后的布局文件可用于流片,然后用于制造改进的集成电路。

著录项

  • 公开/公告号US8543958B2

    专利类型

  • 公开/公告日2013-09-24

    原文格式PDF

  • 申请/专利权人 QIANG CHEN;SRIDHAR TIRUMALA;

    申请/专利号US20090636627

  • 发明设计人 QIANG CHEN;SRIDHAR TIRUMALA;

    申请日2009-12-11

  • 分类号G06F17/50;

  • 国家 US

  • 入库时间 2022-08-21 16:45:40

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