首页>
外国专利>
Testing the compliance of a design with the synchronization requirements of a memory model
Testing the compliance of a design with the synchronization requirements of a memory model
展开▼
机译:测试设计是否符合存储模型的同步要求
展开▼
页面导航
摘要
著录项
相似文献
摘要
A method for compliance testing of a circuit design that includes at least one processor and a memory includes defining a memory model. The memory model includes synchronization mechanisms for synchronizing access to the memory by software instructions in different program threads running on the at least one processor. Synchronization-related parameters, which are applicable to at least one sequence of the software instructions in the different program threads, are specified. A coverage model is defined as a multi-dimensional cross-product of values of the synchronization-related parameters. At least one test program is generated using the coverage model, and a compliance of the design with the memory model is tested by subjecting the design to the at least one test program.
展开▼